Swept-Source-Based Chromatic Confocal Microscopy
Chromatic confocal microscopy (CCM) has been intensively developed because it can exhibit effective focal position scanning based on the axial chromatic aberration of broadband light reflected from a target. To improve the imaging speed of three-dimensional (3D) surface profiling, we have proposed t...
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| Format: | Article |
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MDPI AG
2020-12-01
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| Series: | Sensors |
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| Online Access: | https://www.mdpi.com/1424-8220/20/24/7347 |
| _version_ | 1797543921736220672 |
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| author | Dawoon Jeong Se Jin Park Hansol Jang Hyunjoo Kim Jaesun Kim Chang-Seok Kim |
| author_facet | Dawoon Jeong Se Jin Park Hansol Jang Hyunjoo Kim Jaesun Kim Chang-Seok Kim |
| author_sort | Dawoon Jeong |
| collection | DOAJ |
| description | Chromatic confocal microscopy (CCM) has been intensively developed because it can exhibit effective focal position scanning based on the axial chromatic aberration of broadband light reflected from a target. To improve the imaging speed of three-dimensional (3D) surface profiling, we have proposed the novel concept of swept-source-based CCM (SS-CCM) and investigated the usefulness of the corresponding imaging system. Compared to conventional CCM based on a broadband light source and a spectrometer, a swept-source in the proposed SS-CCM generates light with a narrower linewidth for higher intensity, and a single photodetector employed in the system exhibits a fast and sensitive response by immediately obtaining spectrally encoded depth from a chromatic dispersive lens array. Results of the experiments conducted to test the proposed SS-CCM system indicate that the system exhibits an axial chromatic focal distance range of approximately 360 <inline-formula><math display="inline"><semantics><mrow><mrow><mi mathvariant="sans-serif">μ</mi><mi mathvariant="normal">m</mi></mrow></mrow></semantics></math></inline-formula> for the 770–820 nm swept wavelength range. Moreover, high-speed surface profiling images of a cover glass and coin were successfully obtained with a short measurement time of 5 ms at a single position. |
| first_indexed | 2024-03-10T13:53:02Z |
| format | Article |
| id | doaj.art-757555a6c0b74c21a4240f549ea91a2f |
| institution | Directory Open Access Journal |
| issn | 1424-8220 |
| language | English |
| last_indexed | 2024-03-10T13:53:02Z |
| publishDate | 2020-12-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Sensors |
| spelling | doaj.art-757555a6c0b74c21a4240f549ea91a2f2023-11-21T01:55:06ZengMDPI AGSensors1424-82202020-12-012024734710.3390/s20247347Swept-Source-Based Chromatic Confocal MicroscopyDawoon Jeong0Se Jin Park1Hansol Jang2Hyunjoo Kim3Jaesun Kim4Chang-Seok Kim5Department of Cogno-Mechatronics Engineering, Pusan National University, Busan 46241, KoreaDepartment of Cogno-Mechatronics Engineering, Pusan National University, Busan 46241, KoreaDepartment of Cogno-Mechatronics Engineering, Pusan National University, Busan 46241, KoreaTaihan Fiber Optics Co., Ltd., Ansan-si 15601, Gyeonggi-do, KoreaTaihan Fiber Optics Co., Ltd., Ansan-si 15601, Gyeonggi-do, KoreaDepartment of Cogno-Mechatronics Engineering, Pusan National University, Busan 46241, KoreaChromatic confocal microscopy (CCM) has been intensively developed because it can exhibit effective focal position scanning based on the axial chromatic aberration of broadband light reflected from a target. To improve the imaging speed of three-dimensional (3D) surface profiling, we have proposed the novel concept of swept-source-based CCM (SS-CCM) and investigated the usefulness of the corresponding imaging system. Compared to conventional CCM based on a broadband light source and a spectrometer, a swept-source in the proposed SS-CCM generates light with a narrower linewidth for higher intensity, and a single photodetector employed in the system exhibits a fast and sensitive response by immediately obtaining spectrally encoded depth from a chromatic dispersive lens array. Results of the experiments conducted to test the proposed SS-CCM system indicate that the system exhibits an axial chromatic focal distance range of approximately 360 <inline-formula><math display="inline"><semantics><mrow><mrow><mi mathvariant="sans-serif">μ</mi><mi mathvariant="normal">m</mi></mrow></mrow></semantics></math></inline-formula> for the 770–820 nm swept wavelength range. Moreover, high-speed surface profiling images of a cover glass and coin were successfully obtained with a short measurement time of 5 ms at a single position.https://www.mdpi.com/1424-8220/20/24/7347chromatic confocal microscopychromatic aberrationswept-sourcewavelength-swept laserhigh-speed3D surface profile |
| spellingShingle | Dawoon Jeong Se Jin Park Hansol Jang Hyunjoo Kim Jaesun Kim Chang-Seok Kim Swept-Source-Based Chromatic Confocal Microscopy Sensors chromatic confocal microscopy chromatic aberration swept-source wavelength-swept laser high-speed 3D surface profile |
| title | Swept-Source-Based Chromatic Confocal Microscopy |
| title_full | Swept-Source-Based Chromatic Confocal Microscopy |
| title_fullStr | Swept-Source-Based Chromatic Confocal Microscopy |
| title_full_unstemmed | Swept-Source-Based Chromatic Confocal Microscopy |
| title_short | Swept-Source-Based Chromatic Confocal Microscopy |
| title_sort | swept source based chromatic confocal microscopy |
| topic | chromatic confocal microscopy chromatic aberration swept-source wavelength-swept laser high-speed 3D surface profile |
| url | https://www.mdpi.com/1424-8220/20/24/7347 |
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