Swept-Source-Based Chromatic Confocal Microscopy

Swept-Source-Based Chromatic Confocal Microscopy

Chromatic confocal microscopy (CCM) has been intensively developed because it can exhibit effective focal position scanning based on the axial chromatic aberration of broadband light reflected from a target. To improve the imaging speed of three-dimensional (3D) surface profiling, we have proposed t...

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Bibliographic Details
Main Authors:	Dawoon Jeong, Se Jin Park, Hansol Jang, Hyunjoo Kim, Jaesun Kim, Chang-Seok Kim
Format:	Article
Language:	English
Published:	MDPI AG 2020-12-01
Series:	Sensors
Subjects:	chromatic confocal microscopy chromatic aberration swept-source wavelength-swept laser high-speed 3D surface profile
Online Access:	https://www.mdpi.com/1424-8220/20/24/7347

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