System identification and control parameter optimization for a stylus profiler with exchangeable cantilevers

Stylus instruments are widely used in production metrology due to their robustness. Interchangeable cantilevers allow a wide range of measuring tasks to be covered with one measuring device. When approaching the sample, the positioning of the stylus instrument tip relative to the measurement object...

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Main Authors: Felix Ströer, Katharina Trinkaus, Indek Raid, Jörg Seewig
Format: Article
Language:English
Published: Elsevier 2018-02-01
Series:Engineering Science and Technology, an International Journal
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2215098617313216
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author Felix Ströer
Katharina Trinkaus
Indek Raid
Jörg Seewig
author_facet Felix Ströer
Katharina Trinkaus
Indek Raid
Jörg Seewig
author_sort Felix Ströer
collection DOAJ
description Stylus instruments are widely used in production metrology due to their robustness. Interchangeable cantilevers allow a wide range of measuring tasks to be covered with one measuring device. When approaching the sample, the positioning of the stylus instrument tip relative to the measurement object has to be accomplished in a controlled way in order to prevent damages to the specimen and the stylus cantilever. This is achieved by a closed-loop control. We present a method for the objective description of the stylus cantilever dynamics with system-theoretical techniques and show a simple iterative approach to optimize closed-loop control parameters with boundary conditions.
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spelling doaj.art-75a4e4d7a76c4c29ac15cdefbf6fc72f2022-12-22T03:57:42ZengElsevierEngineering Science and Technology, an International Journal2215-09862018-02-0121111712110.1016/j.jestch.2018.02.012System identification and control parameter optimization for a stylus profiler with exchangeable cantileversFelix StröerKatharina TrinkausIndek RaidJörg SeewigStylus instruments are widely used in production metrology due to their robustness. Interchangeable cantilevers allow a wide range of measuring tasks to be covered with one measuring device. When approaching the sample, the positioning of the stylus instrument tip relative to the measurement object has to be accomplished in a controlled way in order to prevent damages to the specimen and the stylus cantilever. This is achieved by a closed-loop control. We present a method for the objective description of the stylus cantilever dynamics with system-theoretical techniques and show a simple iterative approach to optimize closed-loop control parameters with boundary conditions.http://www.sciencedirect.com/science/article/pii/S2215098617313216Stylus instrumentSystem identificationAutomated closed-loop controlOptimal closed-loop control parameters
spellingShingle Felix Ströer
Katharina Trinkaus
Indek Raid
Jörg Seewig
System identification and control parameter optimization for a stylus profiler with exchangeable cantilevers
Engineering Science and Technology, an International Journal
Stylus instrument
System identification
Automated closed-loop control
Optimal closed-loop control parameters
title System identification and control parameter optimization for a stylus profiler with exchangeable cantilevers
title_full System identification and control parameter optimization for a stylus profiler with exchangeable cantilevers
title_fullStr System identification and control parameter optimization for a stylus profiler with exchangeable cantilevers
title_full_unstemmed System identification and control parameter optimization for a stylus profiler with exchangeable cantilevers
title_short System identification and control parameter optimization for a stylus profiler with exchangeable cantilevers
title_sort system identification and control parameter optimization for a stylus profiler with exchangeable cantilevers
topic Stylus instrument
System identification
Automated closed-loop control
Optimal closed-loop control parameters
url http://www.sciencedirect.com/science/article/pii/S2215098617313216
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