Detection of microcracks and dark spots in monocrystalline PERC cells using photoluminescene imaging and YOLO-based CNN with spatial pyramid pooling

Two common defects encountered during manufacturing of crystalline silicon solar cells are microcrack and dark spot or dark region. The microcrack in particular is a major threat to module performance since it is responsible for most PV failures and other types of damage in the field. On the other h...

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Bibliographic Details
Main Authors: Binomairah Amran, Abdullah Azizi, Khoo Bee Ee, Mahdavipour Zeinab, Teo Teow Wee, Mohd Noor Nor Shahirah, Abdullah Mohd Zaid
Format: Article
Language:English
Published: EDP Sciences 2022-01-01
Series:EPJ Photovoltaics
Subjects:
Online Access:https://www.epj-pv.org/articles/epjpv/full_html/2022/01/pv220063/pv220063.html