Detection of microcracks and dark spots in monocrystalline PERC cells using photoluminescene imaging and YOLO-based CNN with spatial pyramid pooling
Two common defects encountered during manufacturing of crystalline silicon solar cells are microcrack and dark spot or dark region. The microcrack in particular is a major threat to module performance since it is responsible for most PV failures and other types of damage in the field. On the other h...
Main Authors: | , , , , , , |
---|---|
Format: | Article |
Language: | English |
Published: |
EDP Sciences
2022-01-01
|
Series: | EPJ Photovoltaics |
Subjects: | |
Online Access: | https://www.epj-pv.org/articles/epjpv/full_html/2022/01/pv220063/pv220063.html |