Study of Single Event Latch-Up Hardness for CMOS Devices with a Resistor in Front of DC-DC Converter

Study of Single Event Latch-Up Hardness for CMOS Devices with a Resistor in Front of DC-DC Converter

Bulk silicon Complementary Metal Oxide Semiconductor (CMOS) devices have distinct single event latch-up (SEL) problems in aerospace. Therefore, it is essential that CMOS devices are designed with appropriate circuit-level methods. Traditional resistor hardness satisfies the current aerospace trend o...

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Bibliographic Details
Main Authors: Jindou Xin, Xiang Zhu, Yingqi Ma, Jianwei Han
Format: Article
Language:English
Published: MDPI AG 2023-01-01
Series:Electronics
Subjects:
CMOS devices
single event latch-up (SEL)
single event effect (SEE)
resistor
pulsed laser
Online Access:https://www.mdpi.com/2079-9292/12/3/550

Internet

https://www.mdpi.com/2079-9292/12/3/550

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