Novel Method for Direct Observation of Friction Interfaces between SUJ2 Ball and Si3N4 Thin Film Using Scanning Electron Microscopy

In this study, a novel method was developed for in situ scanning electron microscopy (SEM) observations of friction interfaces, from a top view, using a Si3N4 thin film (SiN film), which has high electron transmission ability, and a microtribometer. Nanodiamond (ND) aggregates were adsorbed on the b...

Full description

Bibliographic Details
Main Authors: Hiroshi Kinoshita, Naohiro Matsumoto
Format: Article
Language:English
Published: Japanese Society of Tribologists 2019-12-01
Series:Tribology Online
Subjects:
Online Access:https://www.jstage.jst.go.jp/article/trol/14/5/14_382/_pdf/-char/en