Electrical and morphological study of thermally evaporated (Sb2S3)1-xSnx thin films
(Sb2S3)1-xSnx thin films with different concentrations (0, 0.05 and 0.15) and thicknesses (300,500 and 700nm) have been deposited by single source vacuum thermal evaporation onto glass substrates at ambient temperature to study the effect of tin content, thickness and on its structural morphology,...
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| Format: | Article |
| Language: | English |
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University of Baghdad
2019-02-01
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| Series: | Iraqi Journal of Physics |
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| Online Access: | https://ijp.uobaghdad.edu.iq/index.php/physics/article/view/282 |