Improvement in Electrical Stability of a-IGZO TFTs Using Thinner Dual-Layer Dielectric Film

This study investigates the effect of gate insulators on thin-film transistors (TFTs) using an amorphous InGaZnO<sub>4</sub> (a-IGZO) channel layer. TFTs with single-layer Ta<sub>2</sub>O<sub>5</sub> and dual-layer Ta<sub>2</sub>O<sub>5</sub&g...

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Bibliographic Details
Main Authors: Jong-Woo Kim, Hyun Kyu Seo, Su Yeon Lee, Minsoo Park, Min Kyu Yang, Byeong-Kwon Ju
Format: Article
Language:English
Published: MDPI AG 2022-10-01
Series:Metals
Subjects:
Online Access:https://www.mdpi.com/2075-4701/12/10/1663