Logistic Regression for Machine Learning in Process Tomography

Logistic Regression for Machine Learning in Process Tomography

The main goal of the research presented in this paper was to develop a refined machine learning algorithm for industrial tomography applications. The article presents algorithms based on logistic regression in relation to image reconstruction using electrical impedance tomography (EIT) and ultrasoun...

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Bibliographic Details
Main Authors: Tomasz Rymarczyk, Edward Kozłowski, Grzegorz Kłosowski, Konrad Niderla
Format: Article
Language:English
Published: MDPI AG 2019-08-01
Series:Sensors
Subjects:
machine learning
electrical impedance tomography
ultrasound tomography
process tomography
image reconstruction
Online Access:https://www.mdpi.com/1424-8220/19/15/3400

Internet

https://www.mdpi.com/1424-8220/19/15/3400

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