Computational Simulation of a Field-Induced Charged Board Event Test Bench Using Transient Analysis

This study reported the computational simulation of a test bench prototype for a field-induced charged board event (FICBE) by using transient analysis. The discharge probe and its stray impedance were experimentally measured using an RLC circuit analyzed in the transient mode. The simulation reveale...

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Bibliographic Details
Main Authors: S. Chumpen, S. Pimpakun, S. Plong-Ngooluam, S. H. Voldman, C. Sa-Ngiamsak
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10145462/