Super-compression of large electron microscopy time series by deep compressive sensing learning
Summary: The development of ultrafast detectors for electron microscopy (EM) opens a new door to exploring dynamics of nanomaterials; however, it raises grand challenges for big data processing and storage. Here, we combine deep learning and temporal compressive sensing (TCS) to propose a novel EM b...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2021-07-01
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| Series: | Patterns |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2666389921001252 |