Automatic Evaluation of Wheat Resistance to Fusarium Head Blight Using Dual Mask-RCNN Deep Learning Frameworks in Computer Vision

Automatic Evaluation of Wheat Resistance to Fusarium Head Blight Using Dual Mask-RCNN Deep Learning Frameworks in Computer Vision

In many regions of the world, wheat is vulnerable to severe yield and quality losses from the fungus disease of Fusarium head blight (FHB). The development of resistant cultivars is one means of ameliorating the devastating effects of this disease, but the breeding process requires the evaluation of...

Full description

Bibliographic Details
Main Authors: Wen-Hao Su, Jiajing Zhang, Ce Yang, Rae Page, Tamas Szinyei, Cory D. Hirsch, Brian J. Steffenson
Format: Article
Language:English
Published: MDPI AG 2020-12-01
Series:Remote Sensing
Subjects:
deep learning
wheat spike
Fusarium head blight
target recognition
computer vision
Online Access:https://www.mdpi.com/2072-4292/13/1/26

Internet

https://www.mdpi.com/2072-4292/13/1/26

Similar Items