Revealing low-loss dielectric near-field modes of hexagonal boron nitride by photoemission electron microscopy

Revealing low-loss dielectric near-field modes of hexagonal boron nitride by photoemission electron microscopy

Abstract Low-loss dielectric modes are important features and functional bases of fundamental optical components in on-chip optical devices. However, dielectric near-field modes are challenging to reveal with high spatiotemporal resolution and fast direct imaging. Herein, we present a method to addr...

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Bibliographic Details
Main Authors: Yaolong Li, Pengzuo Jiang, Xiaying Lyu, Xiaofang Li, Huixin Qi, Jinglin Tang, Zhaohang Xue, Hong Yang, Guowei Lu, Quan Sun, Xiaoyong Hu, Yunan Gao, Qihuang Gong
Format: Article
Language:English
Published: Nature Portfolio 2023-08-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-023-40603-4

Internet

https://doi.org/10.1038/s41467-023-40603-4

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