High-throughput XPS spectrum modeling with autonomous background subtraction for 3d5/2 peak mapping of SnS
We propose a fitting model that automatically conducts the background subtraction during high-throughput peak fitting. The fitting model consists of the pseudo-Voigt mixture model and the ramp-sum background model, and each model represents the peak and background component, respectively. The optimi...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Taylor & Francis Group
2023-12-01
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| Series: | Science and Technology of Advanced Materials: Methods |
| Subjects: | |
| Online Access: | http://dx.doi.org/10.1080/27660400.2022.2159753 |