Genetic architecture of highly complex chemical resistance traits across four yeast strains.

Genetic architecture of highly complex chemical resistance traits across four yeast strains.

Many questions about the genetic basis of complex traits remain unanswered. This is in part due to the low statistical power of traditional genetic mapping studies. We used a statistically powerful approach, extreme QTL mapping (X-QTL), to identify the genetic basis of resistance to 13 chemicals in...

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Bibliographic Details
Main Authors: Ian M Ehrenreich, Joshua Bloom, Noorossadat Torabi, Xin Wang, Yue Jia, Leonid Kruglyak
Format: Article
Language:English
Published: Public Library of Science (PLoS) 2012-01-01
Series:PLoS Genetics
Online Access:http://europepmc.org/articles/PMC3305394?pdf=render

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http://europepmc.org/articles/PMC3305394?pdf=render

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