In Situ Study on Cu-to-Cu Thermal Compression Bonding

Cu-to-Cu thermal compression bonding (TCB) has emerged as a promising solution for ultrafine pitch packaging in 3D integrated circuit technologies. Despite the progress made by conventional Cu-to-Cu TCB methods in achieving good mechanical strength of the Cu bonds, the bonding processes generally re...

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Bibliographic Details
Main Authors: Tongjun Niu, Ke Xu, Chao Shen, Tianyi Sun, Justin Oberst, Carol A. Handwerker, Ganesh Subbarayan, Haiyan Wang, Xinghang Zhang
Format: Article
Language:English
Published: MDPI AG 2023-06-01
Series:Crystals
Subjects:
Online Access:https://www.mdpi.com/2073-4352/13/7/989