Simulation of 50-500 MeV Quasi-monoenergetic Neutron Source for Single Event Effect Irradiation Experiment
The neutron-induced single event effect affects the reliability of electronic devices used in aircraft and ground nuclear facilities. With the progress of semiconductor technology, device feature sizes become smaller and more integrated, radiation sensitivity increases and neutron single event effec...
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| Format: | Article |
| Language: | English |
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Editorial Board of Atomic Energy Science and Technology
2023-08-01
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| Series: | Yuanzineng kexue jishu |
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| Online Access: | https://www.aest.org.cn/CN/10.7538/yzk.2022.youxian.0881 |