Study on CDM ESD Robustness Among On-Chip Decoupling Capacitors in CMOS Integrated Circuits
The integrated circuit (IC) products fabricated in the scaled-down CMOS processes with higher clock rate and lower power supply voltage (V<sub>DD</sub>) are more sensitive to the transient/switching noises on the power lines with the parasitic inductance induced by the bonding wire. The...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2021-01-01
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| Series: | IEEE Journal of the Electron Devices Society |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9555812/ |