Advanced method for the accurate measurement of tilt angle in a transmission electron microscopy goniometer
Abstract Background In order to improve the reliability of the electron tomography (ET) technique, which reveals three-dimensional information of nanostructured materials from a series of tilted two-dimensional images, it is essential that the mechanical tilt angle be accurately measured by the tran...
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
SpringerOpen
2018-01-01
|
| Series: | Journal of Analytical Science and Technology |
| Subjects: | |
| Online Access: | http://link.springer.com/article/10.1186/s40543-018-0140-6 |