Characterization of crack growth resistance under thermal shock on silicon nitride with various microstructure

The crack growth resistance under thermal shock loading on silicon nitride was characterized using Disc-on-Rod test which was developed by the authors. The microdamage during thermal shock fracture was monitored by acoustic emission (AE) technique. Specimens were composed of β-Si3N4 with an acicular...

Full description

Bibliographic Details
Main Authors: Takenobu SAKAI, Shuichi WAKAYAMA, Go KAMETANI, Katsumi YOSHIDA, Takashi AKATSU
Format: Article
Language:English
Published: The Japan Society of Mechanical Engineers 2014-02-01
Series:Mechanical Engineering Journal
Subjects:
Online Access:https://www.jstage.jst.go.jp/article/mej/1/1/1_2014smm0002/_pdf/-char/en

Similar Items