The kinetics of nanostructural relaxation in electrodeposited Ni upon low-temperature annealing: an in-situ X-ray diffraction investigation
The rather limited microstructural evolution in electrodeposited nanocrystalline Ni isothermally annealed at 453–493 K is investigated by using in situ X-ray diffraction technique. The nanostructural relaxation features roughly linear lattice contraction, based on which the kinetics analysis yields...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2022-05-01
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| Series: | Journal of Materials Research and Technology |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2238785422005981 |