IR surface polariton spectroscopy as a method for studying the optical properties of ultra thin films
Experimental results of investigation of optical properties of MgO thin films (thickness 10, 30, 100 и 300 nm) and AlN films (thickness 40 и 400 nm) on sapphire substrate are discussed. The optical phonon frequencies of these films are located in frequency region of surface polariton of sapphire. Du...
Main Author: | |
---|---|
Format: | Article |
Language: | English |
Published: |
EDP Sciences
2017-01-01
|
Series: | EPJ Web of Conferences |
Online Access: | http://dx.doi.org/10.1051/epjconf/201713201002 |