IR surface polariton spectroscopy as a method for studying the optical properties of ultra thin films
Experimental results of investigation of optical properties of MgO thin films (thickness 10, 30, 100 и 300 nm) and AlN films (thickness 40 и 400 nm) on sapphire substrate are discussed. The optical phonon frequencies of these films are located in frequency region of surface polariton of sapphire. Du...
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Format: | Article |
Language: | English |
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EDP Sciences
2017-01-01
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Series: | EPJ Web of Conferences |
Online Access: | http://dx.doi.org/10.1051/epjconf/201713201002 |
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author | Vinogradov E.A. |
author_facet | Vinogradov E.A. |
author_sort | Vinogradov E.A. |
collection | DOAJ |
description | Experimental results of investigation of optical properties of MgO thin films (thickness 10, 30, 100 и 300 nm) and AlN films (thickness 40 и 400 nm) on sapphire substrate are discussed. The optical phonon frequencies of these films are located in frequency region of surface polariton of sapphire. Due to the resonance between them the splitting and the shift of absorption spectra of sapphire surface polariton appear. From these experimental data it is possible to reconstruct all constants of the permittivity of both the film and substrate, the film thickness, and to specify its structure. |
first_indexed | 2024-12-13T21:12:03Z |
format | Article |
id | doaj.art-7c7adfba2460486bb45613b164811aff |
institution | Directory Open Access Journal |
issn | 2100-014X |
language | English |
last_indexed | 2024-12-13T21:12:03Z |
publishDate | 2017-01-01 |
publisher | EDP Sciences |
record_format | Article |
series | EPJ Web of Conferences |
spelling | doaj.art-7c7adfba2460486bb45613b164811aff2022-12-21T23:31:19ZengEDP SciencesEPJ Web of Conferences2100-014X2017-01-011320100210.1051/epjconf/201713201002epjconf_spectro2017_01002IR surface polariton spectroscopy as a method for studying the optical properties of ultra thin filmsVinogradov E.A.Experimental results of investigation of optical properties of MgO thin films (thickness 10, 30, 100 и 300 nm) and AlN films (thickness 40 и 400 nm) on sapphire substrate are discussed. The optical phonon frequencies of these films are located in frequency region of surface polariton of sapphire. Due to the resonance between them the splitting and the shift of absorption spectra of sapphire surface polariton appear. From these experimental data it is possible to reconstruct all constants of the permittivity of both the film and substrate, the film thickness, and to specify its structure.http://dx.doi.org/10.1051/epjconf/201713201002 |
spellingShingle | Vinogradov E.A. IR surface polariton spectroscopy as a method for studying the optical properties of ultra thin films EPJ Web of Conferences |
title | IR surface polariton spectroscopy as a method for studying the optical properties of ultra thin films |
title_full | IR surface polariton spectroscopy as a method for studying the optical properties of ultra thin films |
title_fullStr | IR surface polariton spectroscopy as a method for studying the optical properties of ultra thin films |
title_full_unstemmed | IR surface polariton spectroscopy as a method for studying the optical properties of ultra thin films |
title_short | IR surface polariton spectroscopy as a method for studying the optical properties of ultra thin films |
title_sort | ir surface polariton spectroscopy as a method for studying the optical properties of ultra thin films |
url | http://dx.doi.org/10.1051/epjconf/201713201002 |
work_keys_str_mv | AT vinogradovea irsurfacepolaritonspectroscopyasamethodforstudyingtheopticalpropertiesofultrathinfilms |