IR surface polariton spectroscopy as a method for studying the optical properties of ultra thin films

Experimental results of investigation of optical properties of MgO thin films (thickness 10, 30, 100 и 300 nm) and AlN films (thickness 40 и 400 nm) on sapphire substrate are discussed. The optical phonon frequencies of these films are located in frequency region of surface polariton of sapphire. Du...

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Main Author: Vinogradov E.A.
Format: Article
Language:English
Published: EDP Sciences 2017-01-01
Series:EPJ Web of Conferences
Online Access:http://dx.doi.org/10.1051/epjconf/201713201002
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author Vinogradov E.A.
author_facet Vinogradov E.A.
author_sort Vinogradov E.A.
collection DOAJ
description Experimental results of investigation of optical properties of MgO thin films (thickness 10, 30, 100 и 300 nm) and AlN films (thickness 40 и 400 nm) on sapphire substrate are discussed. The optical phonon frequencies of these films are located in frequency region of surface polariton of sapphire. Due to the resonance between them the splitting and the shift of absorption spectra of sapphire surface polariton appear. From these experimental data it is possible to reconstruct all constants of the permittivity of both the film and substrate, the film thickness, and to specify its structure.
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spelling doaj.art-7c7adfba2460486bb45613b164811aff2022-12-21T23:31:19ZengEDP SciencesEPJ Web of Conferences2100-014X2017-01-011320100210.1051/epjconf/201713201002epjconf_spectro2017_01002IR surface polariton spectroscopy as a method for studying the optical properties of ultra thin filmsVinogradov E.A.Experimental results of investigation of optical properties of MgO thin films (thickness 10, 30, 100 и 300 nm) and AlN films (thickness 40 и 400 nm) on sapphire substrate are discussed. The optical phonon frequencies of these films are located in frequency region of surface polariton of sapphire. Due to the resonance between them the splitting and the shift of absorption spectra of sapphire surface polariton appear. From these experimental data it is possible to reconstruct all constants of the permittivity of both the film and substrate, the film thickness, and to specify its structure.http://dx.doi.org/10.1051/epjconf/201713201002
spellingShingle Vinogradov E.A.
IR surface polariton spectroscopy as a method for studying the optical properties of ultra thin films
EPJ Web of Conferences
title IR surface polariton spectroscopy as a method for studying the optical properties of ultra thin films
title_full IR surface polariton spectroscopy as a method for studying the optical properties of ultra thin films
title_fullStr IR surface polariton spectroscopy as a method for studying the optical properties of ultra thin films
title_full_unstemmed IR surface polariton spectroscopy as a method for studying the optical properties of ultra thin films
title_short IR surface polariton spectroscopy as a method for studying the optical properties of ultra thin films
title_sort ir surface polariton spectroscopy as a method for studying the optical properties of ultra thin films
url http://dx.doi.org/10.1051/epjconf/201713201002
work_keys_str_mv AT vinogradovea irsurfacepolaritonspectroscopyasamethodforstudyingtheopticalpropertiesofultrathinfilms