BARRIER HEIGHT AND CHANGING INSULATOR THICKNESS OF THIN FILM MIS JUNCTIONS
Using thermal evaporation, metal-semiconductor and metal-insulator-semiconductor thin-films were prepared. By using experimental I-V and activation energy measurements, it was determined that barrier height ( ) increases as the thickness of the insulator increases.
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Format: | Article |
Language: | English |
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University of Anbar
2017-12-01
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Series: | مجلة جامعة الانبار للعلوم الصرفة |
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Online Access: | https://juaps.uoanbar.edu.iq/article_135153_8d6ed1025105ee13e6e29720237bc573.pdf |
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author | JassimMohammed Salih |
author_facet | JassimMohammed Salih |
author_sort | JassimMohammed Salih |
collection | DOAJ |
description | Using thermal evaporation, metal-semiconductor and metal-insulator-semiconductor thin-films were prepared. By using experimental I-V and activation energy measurements, it was determined that barrier height ( ) increases as the thickness of the insulator increases. |
first_indexed | 2024-03-08T18:47:01Z |
format | Article |
id | doaj.art-7c8d7507a9874cec9163df6fda1adc78 |
institution | Directory Open Access Journal |
issn | 1991-8941 2706-6703 |
language | English |
last_indexed | 2024-03-08T18:47:01Z |
publishDate | 2017-12-01 |
publisher | University of Anbar |
record_format | Article |
series | مجلة جامعة الانبار للعلوم الصرفة |
spelling | doaj.art-7c8d7507a9874cec9163df6fda1adc782023-12-28T21:58:42ZengUniversity of Anbarمجلة جامعة الانبار للعلوم الصرفة1991-89412706-67032017-12-01103354010.37652/juaps.2016.135153135153BARRIER HEIGHT AND CHANGING INSULATOR THICKNESS OF THIN FILM MIS JUNCTIONSJassimMohammed Salih0University Of Anbar - College of ScienceUsing thermal evaporation, metal-semiconductor and metal-insulator-semiconductor thin-films were prepared. By using experimental I-V and activation energy measurements, it was determined that barrier height ( ) increases as the thickness of the insulator increases.https://juaps.uoanbar.edu.iq/article_135153_8d6ed1025105ee13e6e29720237bc573.pdfbarrier heightinsulator thicknessthin film mis |
spellingShingle | JassimMohammed Salih BARRIER HEIGHT AND CHANGING INSULATOR THICKNESS OF THIN FILM MIS JUNCTIONS مجلة جامعة الانبار للعلوم الصرفة barrier height insulator thickness thin film mis |
title | BARRIER HEIGHT AND CHANGING INSULATOR THICKNESS OF THIN FILM MIS JUNCTIONS |
title_full | BARRIER HEIGHT AND CHANGING INSULATOR THICKNESS OF THIN FILM MIS JUNCTIONS |
title_fullStr | BARRIER HEIGHT AND CHANGING INSULATOR THICKNESS OF THIN FILM MIS JUNCTIONS |
title_full_unstemmed | BARRIER HEIGHT AND CHANGING INSULATOR THICKNESS OF THIN FILM MIS JUNCTIONS |
title_short | BARRIER HEIGHT AND CHANGING INSULATOR THICKNESS OF THIN FILM MIS JUNCTIONS |
title_sort | barrier height and changing insulator thickness of thin film mis junctions |
topic | barrier height insulator thickness thin film mis |
url | https://juaps.uoanbar.edu.iq/article_135153_8d6ed1025105ee13e6e29720237bc573.pdf |
work_keys_str_mv | AT jassimmohammedsalih barrierheightandchanginginsulatorthicknessofthinfilmmisjunctions |