Control charts using half-normal and half-exponential power distributions using repetitive sampling

Control charts using half-normal and half-exponential power distributions using repetitive sampling

Abstract This manuscript presents the development of an attribute control chart (ACC) designed to monitor the number of defective items in manufacturing processes. The charts are specifically tailored using time-truncated life test (TTLT) for two lifetime data distributions: the half-normal distribu...

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Bibliographic Details
Main Authors: Muhammad Naveed, Muhammad Azam, Nasrullah Khan, Muhammad Aslam, Muhammad Saleem, Muhammad Saeed
Format: Article
Language:English
Published: Nature Portfolio 2024-01-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-023-50137-w

Internet

https://doi.org/10.1038/s41598-023-50137-w

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