A Parameter Refinement Method for Ptychography Based on Deep Learning Concepts
X-ray ptychography is an advanced computational microscopy technique, which is delivering exceptionally detailed quantitative imaging of biological and nanotechnology specimens, which can be used for high-precision X-ray measurements. However, coarse parametrisation in propagation distance, position...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-10-01
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| Series: | Condensed Matter |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2410-3896/6/4/36 |