Correction: Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy

Bibliographic Details
Main Authors:	Cameron H. Parvini, M. A. S. R. Saadi, Santiago D. Solares
Format:	Article
Language:	English
Published:	Beilstein-Institut 2021-01-01
Series:	Beilstein Journal of Nanotechnology
Subjects:	atomic force microscopy (afm) creep force mapping indentation kelvin–voigt static force spectroscopy (sfs) viscoelasticity
Online Access:	https://doi.org/10.3762/bjnano.12.10

Internet

https://doi.org/10.3762/bjnano.12.10