CHARACTERIZATION OF SURFACE OF THE (010) FACE OF BORAX CRYSTALS USING EX SITU ATOMIC FORCE MICROSCOPY (AFM):
The surface topology of borax crystals grown at a relative supersaturation of 0.21 has been investigated using ex situ atomic force microscopy (AFM). It was found that the cleavage of borax crystals along the (010) face planes has features of the cleavage of layered compounds, exhibiting cleavage s...
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| Médium: | Článek |
| Jazyk: | English |
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Department of Chemistry, Universitas Gadjah Mada
2010-06-01
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| Edice: | Indonesian Journal of Chemistry |
| On-line přístup: | https://jurnal.ugm.ac.id/ijc/article/view/21803 |