Improving the electrical stability of a‐IGZO TFT through gate surround structures

Abstract This paper delves into a structural modification of dual‐gate oxide thin film transistor (TFT). Diverging from the conventional dual‐gate TFT structure, the authors’ approach connects the bottom and top gate electrodes, effectively enveloping all four sides of the a‐IGZO channel. This shiel...

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Bibliographic Details
Main Authors: Eun Seong Yu, Seung Gyun Kim, Seung Jae Moon, Byung Seong Bae
Format: Article
Language:English
Published: Wiley 2023-10-01
Series:Electronics Letters
Subjects:
Online Access:https://doi.org/10.1049/ell2.12977