EBIC Imaging of Conductive Paths Formed in Graphene Oxide as a Result of Resistive Switching
The electron-beam-induced current (EBIC) method is utilized in this work to visualize conductive channels formed in graphene oxide as a result of resistive switching. Using metal–insulator–semiconductor (MIS) structures, an increase in the electron beam induced current by a few orders of magnitude a...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2023-02-01
|
| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/13/4/2481 |