Annihilation of Highly-Charged Topological Defects

Annihilation of Highly-Charged Topological Defects

We studied numerically external stimuli enforced annihilation of a pair of daughter nematic topological defect (TD) assemblies bearing a relatively strong topological charge <inline-formula><math display="inline"><semantics><mrow><mrow><mo>|</mo>&l...

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Bibliographic Details
Main Authors: Eva Klemenčič, Pavlo Kurioz, Milan Ambrožič, Charles Rosenblatt, Samo Kralj
Format: Article
Language:English
Published: MDPI AG 2020-08-01
Series:Crystals
Subjects:
liquid crystals
topological defects
annihilation
order reconstruction
Online Access:https://www.mdpi.com/2073-4352/10/8/673

Internet

https://www.mdpi.com/2073-4352/10/8/673

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