Hot Spot Analysis of Photovoltaic Module under Partial Shading Conditions by Using IR-Imaging Technology

The probable appearance of localized overheating (hot spot) represents one of the main matters for the reliability and safety of c-Si cells. It entails both a risk for the photovoltaic module's lifetime and a decrease in its operational efficiency. Partial shading is the most common cause of a...

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Bibliographic Details
Main Authors: Ali. Numan, Hashim Hussein, Zahraa Dawood
Format: Article
Language:English
Published: Unviversity of Technology- Iraq 2021-09-01
Series:Engineering and Technology Journal
Subjects:
Online Access:https://etj.uotechnology.edu.iq/article_169287_baca76f1edaaaa6a63ee6b5abc070d85.pdf