MeaSSUre:I-V: Open software for transistor characterization using source-meter units
Despite the importance of transistors in modern electronics, transistor characterization requires expensive instruments that are not affordable for many researchers, engineers and educators. Here, we present software that can control source-meter units (SMUs) for current–voltage (I–V) characterizati...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2023-02-01
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| Series: | SoftwareX |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2352711023000146 |