A Multiscale Deep‐Learning Model for Atom Identification from Low‐Signal‐to‐Noise‐Ratio Transmission Electron Microscopy Images

Recent advancements in transmission electron microscopy (TEM) have enabled the study of atomic structures of materials at unprecedented scales as small as tens of picometers (pm). However, accurately detecting atomic positions from TEM images remains a challenging task. Traditional Gaussian fitting...

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Bibliographic Details
Main Authors: Yanyu Lin, Zhangyuan Yan, Chi Shing Tsang, Lok Wing Wong, Xiaodong Zheng, Fangyuan Zheng, Jiong Zhao, Ke Chen
Format: Article
Language:English
Published: Wiley-VCH 2023-08-01
Series:Small Science
Subjects:
Online Access:https://doi.org/10.1002/smsc.202300031