A Fast Loss Model for Cascode GaN-FETs and Real-Time Degradation-Sensitive Control of Solid-State Transformers

This paper proposes a novel, degradation-sensitive, adaptive SST controller for cascode GaN-FETs. Unlike in traditional transformers, a semiconductor switch’s degradation and failure can compromise its robustness and integrity. It is vital to continuously monitor a switch’s health condition to adapt...

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Bibliographic Details
Main Authors: Moinul Shahidul Haque, Md Moniruzzaman, Seungdeog Choi, Sangshin Kwak, Ahmed H. Okilly, Jeihoon Baek
Format: Article
Language:English
Published: MDPI AG 2023-04-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/23/9/4395