Correlating Time Series Signals and Event Logs in Embedded Systems
In many embedded systems, we face the problem of correlating signals characterising device operation (e.g., performance parameters, anomalies) with events describing internal device activities. This leads to the investigation of two types of data: time series, representing signal periodic samples in...
| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-10-01
|
| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/21/21/7128 |