Effect of Probabilistic Similarity Measure on Metric-Based Few-Shot Classification
In developing a few-shot classification model using deep networks, the limited number of samples in each class causes difficulty in utilizing statistical characteristics of the class distributions. In this paper, we propose a method to treat this difficulty by combining a probabilistic similarity ba...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-11-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/11/22/10977 |