Effect of laser fluence on structural and optical properties of CuxS films grown by pulsed laser deposition at different wavelengths
Cu _x S thin films were grown onto soda-lime glass substrates by pulsed laser deposition at two different wavelengths: 1064 and 532 nm. X-ray diffraction, Raman and UV–vis spectroscopies were used to characterize the Cu _x S films. Results are presented as a function of laser fluence. XRD patterns i...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2020-01-01
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| Series: | Materials Research Express |
| Subjects: | |
| Online Access: | https://doi.org/10.1088/2053-1591/ab663d |