An Early-Life NAND Flash Endurance Prediction System

An Early-Life NAND Flash Endurance Prediction System

NAND flash memory – ubiquitous in today’s world of smart phones, SSDs (solid state drives), and cloud storage – has a number of well-known reliability problems. NAND data contains bit errors, which require the use of error correcting codes (ECCs). The raw bit error r...

Full description

Bibliographic Details
Main Authors: Barry Fitzgerald, Conor Ryan, Joe Sullivan
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
NAND flash
solid state drives
endurance
retention
machine learning
gradient boosting
Online Access:https://ieeexplore.ieee.org/document/9597529/

Internet

https://ieeexplore.ieee.org/document/9597529/

Similar Items