Site-controlled quantum dots fabricated using an atomic-force microscope assisted technique

Site-controlled quantum dots fabricated using an atomic-force microscope assisted technique

<p>Abstract</p><p>An atomic-force microscope assisted technique is developed to control the position and size of self-assembled semiconductor quantum dots (QDs). Presently, the site precision is as good as &#177; 1.5 nm and the size fluctuation is within &#177; 5% with the...

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Bibliographic Details
Main Authors: Sakuma Y, Kawabe M, Okada Y, Song HZ, Usuki T, Ohshima T, Takemoto K, Miyazawa T, Hirose S, Nakata Y, Takatsu M, Yokoyama N
Format: Article
Language:English
Published: SpringerOpen 2006-01-01
Series:Nanoscale Research Letters
Subjects:
Quantum dot
Site-Control
Atomic-force microscope
Local oxidation
Quantum computer
Quantum communication
Online Access:http://dx.doi.org/10.1007/s11671-006-9012-x

Internet

http://dx.doi.org/10.1007/s11671-006-9012-x

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