X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper

X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper

The X-ray reflectivity technique can provide out-of-plane electron-density profiles of surfaces, interfaces, and thin films, with atomic resolution accuracy. While current methodologies require high surface flatness, this becomes challenging for naturally curved surfaces, particularly for liquid met...

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Bibliographic Details
Main Authors: Oleg V. Konovalov, Valentina Belova, Francesco La Porta, Mehdi Saedi, Irene M. N. Groot, Gilles Renaud, Irina Snigireva, Anatoly Snigirev, Maria Voevodina, Chen Shen, Andrea Sartori, Bridget M. Murphy, Maciej Jankowski
Format: Article
Language:English
Published: International Union of Crystallography 2022-05-01
Series:Journal of Synchrotron Radiation
Subjects:
x-ray reflectivity
curved surfaces
methods
synchrotron
Online Access:http://scripts.iucr.org/cgi-bin/paper?S1600577522002053

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http://scripts.iucr.org/cgi-bin/paper?S1600577522002053

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