X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper
The X-ray reflectivity technique can provide out-of-plane electron-density profiles of surfaces, interfaces, and thin films, with atomic resolution accuracy. While current methodologies require high surface flatness, this becomes challenging for naturally curved surfaces, particularly for liquid met...
| Main Authors: | , , , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
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International Union of Crystallography
2022-05-01
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| Series: | Journal of Synchrotron Radiation |
| Subjects: | |
| Online Access: | http://scripts.iucr.org/cgi-bin/paper?S1600577522002053 |
| _version_ | 1818030468158717952 |
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| author | Oleg V. Konovalov Valentina Belova Francesco La Porta Mehdi Saedi Irene M. N. Groot Gilles Renaud Irina Snigireva Anatoly Snigirev Maria Voevodina Chen Shen Andrea Sartori Bridget M. Murphy Maciej Jankowski |
| author_facet | Oleg V. Konovalov Valentina Belova Francesco La Porta Mehdi Saedi Irene M. N. Groot Gilles Renaud Irina Snigireva Anatoly Snigirev Maria Voevodina Chen Shen Andrea Sartori Bridget M. Murphy Maciej Jankowski |
| author_sort | Oleg V. Konovalov |
| collection | DOAJ |
| description | The X-ray reflectivity technique can provide out-of-plane electron-density profiles of surfaces, interfaces, and thin films, with atomic resolution accuracy. While current methodologies require high surface flatness, this becomes challenging for naturally curved surfaces, particularly for liquid metals, due to the very high surface tension. Here, the development of X-ray reflectivity measurements with beam sizes of a few tens of micrometres on highly curved liquid surfaces using a synchrotron diffractometer equipped with a double crystal beam deflector is presented. The proposed and developed method, which uses a standard reflectivity θ–2θ scan, is successfully applied to study in situ the bare surface of molten copper and molten copper covered by a graphene layer grown in situ by chemical vapor deposition. It was found that the roughness of the bare liquid surface of copper at 1400 K is 1.25 ± 0.10 Å, while the graphene layer is separated from the liquid surface by a distance of 1.55 ± 0.08 Å and has a roughness of 1.26 ± 0.09 Å. |
| first_indexed | 2024-12-10T05:36:03Z |
| format | Article |
| id | doaj.art-80ac1c729a6d4e66bb184ecd5712239d |
| institution | Directory Open Access Journal |
| issn | 1600-5775 |
| language | English |
| last_indexed | 2024-12-10T05:36:03Z |
| publishDate | 2022-05-01 |
| publisher | International Union of Crystallography |
| record_format | Article |
| series | Journal of Synchrotron Radiation |
| spelling | doaj.art-80ac1c729a6d4e66bb184ecd5712239d2022-12-22T02:00:24ZengInternational Union of CrystallographyJournal of Synchrotron Radiation1600-57752022-05-0129371172010.1107/S1600577522002053ju5041X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copperOleg V. Konovalov0Valentina Belova1Francesco La Porta2Mehdi Saedi3Irene M. N. Groot4Gilles Renaud5Irina Snigireva6Anatoly Snigirev7Maria Voevodina8Chen Shen9Andrea Sartori10Bridget M. Murphy11Maciej Jankowski12ESRF – The European Synchrotron, 71 Avenue des Martyrs, 38043 Grenoble, FranceESRF – The European Synchrotron, 71 Avenue des Martyrs, 38043 Grenoble, FranceESRF – The European Synchrotron, 71 Avenue des Martyrs, 38043 Grenoble, FranceLeiden Institute of Chemistry, Leiden University, PO Box 9502, 2300 RA Leiden, The NetherlandsLeiden Institute of Chemistry, Leiden University, PO Box 9502, 2300 RA Leiden, The NetherlandsUniv. Grenoble Alpes, CEA, IRIG/MEM/NRS, 38000 Grenoble, FranceESRF – The European Synchrotron, 71 Avenue des Martyrs, 38043 Grenoble, FranceImmanuel Kant Baltic Federal University, 14 Nevskogo, 236041 Kaliningrad, Russian FederationImmanuel Kant Baltic Federal University, 14 Nevskogo, 236041 Kaliningrad, Russian FederationDeutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, GermanyInstitute for Experimental and Applied Physics, Kiel University, Olshausenstrasse 40, 24098 Kiel, GermanyInstitute for Experimental and Applied Physics, Kiel University, Olshausenstrasse 40, 24098 Kiel, GermanyESRF – The European Synchrotron, 71 Avenue des Martyrs, 38043 Grenoble, FranceThe X-ray reflectivity technique can provide out-of-plane electron-density profiles of surfaces, interfaces, and thin films, with atomic resolution accuracy. While current methodologies require high surface flatness, this becomes challenging for naturally curved surfaces, particularly for liquid metals, due to the very high surface tension. Here, the development of X-ray reflectivity measurements with beam sizes of a few tens of micrometres on highly curved liquid surfaces using a synchrotron diffractometer equipped with a double crystal beam deflector is presented. The proposed and developed method, which uses a standard reflectivity θ–2θ scan, is successfully applied to study in situ the bare surface of molten copper and molten copper covered by a graphene layer grown in situ by chemical vapor deposition. It was found that the roughness of the bare liquid surface of copper at 1400 K is 1.25 ± 0.10 Å, while the graphene layer is separated from the liquid surface by a distance of 1.55 ± 0.08 Å and has a roughness of 1.26 ± 0.09 Å.http://scripts.iucr.org/cgi-bin/paper?S1600577522002053x-ray reflectivitycurved surfacesmethodssynchrotron |
| spellingShingle | Oleg V. Konovalov Valentina Belova Francesco La Porta Mehdi Saedi Irene M. N. Groot Gilles Renaud Irina Snigireva Anatoly Snigirev Maria Voevodina Chen Shen Andrea Sartori Bridget M. Murphy Maciej Jankowski X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper Journal of Synchrotron Radiation x-ray reflectivity curved surfaces methods synchrotron |
| title | X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper |
| title_full | X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper |
| title_fullStr | X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper |
| title_full_unstemmed | X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper |
| title_short | X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper |
| title_sort | x ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper |
| topic | x-ray reflectivity curved surfaces methods synchrotron |
| url | http://scripts.iucr.org/cgi-bin/paper?S1600577522002053 |
| work_keys_str_mv | AT olegvkonovalov xrayreflectivityfromcurvedsurfacesasillustratedbyagraphenelayeronmoltencopper AT valentinabelova xrayreflectivityfromcurvedsurfacesasillustratedbyagraphenelayeronmoltencopper AT francescolaporta xrayreflectivityfromcurvedsurfacesasillustratedbyagraphenelayeronmoltencopper AT mehdisaedi xrayreflectivityfromcurvedsurfacesasillustratedbyagraphenelayeronmoltencopper AT irenemngroot xrayreflectivityfromcurvedsurfacesasillustratedbyagraphenelayeronmoltencopper AT gillesrenaud xrayreflectivityfromcurvedsurfacesasillustratedbyagraphenelayeronmoltencopper AT irinasnigireva xrayreflectivityfromcurvedsurfacesasillustratedbyagraphenelayeronmoltencopper AT anatolysnigirev xrayreflectivityfromcurvedsurfacesasillustratedbyagraphenelayeronmoltencopper AT mariavoevodina xrayreflectivityfromcurvedsurfacesasillustratedbyagraphenelayeronmoltencopper AT chenshen xrayreflectivityfromcurvedsurfacesasillustratedbyagraphenelayeronmoltencopper AT andreasartori xrayreflectivityfromcurvedsurfacesasillustratedbyagraphenelayeronmoltencopper AT bridgetmmurphy xrayreflectivityfromcurvedsurfacesasillustratedbyagraphenelayeronmoltencopper AT maciejjankowski xrayreflectivityfromcurvedsurfacesasillustratedbyagraphenelayeronmoltencopper |