Beyond Scanning Electron Microscopy: Comprehensive Pore Analysis in Transparent Ceramics Using Optical Microscopy

Beyond Scanning Electron Microscopy: Comprehensive Pore Analysis in Transparent Ceramics Using Optical Microscopy

Developing an effective method of quantifying defects in the bulk of transparent ceramics is a challenging task that could facilitate their widespread use as a substitute for single crystals. Conventionally, SEM analysis is used to examine the microstructure but it is limited to the material surface...

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Bibliographic Details
Main Authors: Francesco Picelli, Jan Hostaša, Andreana Piancastelli, Valentina Biasini, Cesare Melandri, Laura Esposito
Format: Article
Language:English
Published: MDPI AG 2024-03-01
Series:Ceramics
Subjects:
transparent ceramics
YAG
optical microscope
residual porosity
pore quantification
Online Access:https://www.mdpi.com/2571-6131/7/1/25

Internet

https://www.mdpi.com/2571-6131/7/1/25

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