Spectroscopic ellipsometry, optical, structural and electrical investigation of sprayed pure and Sn-doped ZnO thin films

Spectroscopic ellipsometry, optical, structural and electrical investigation of sprayed pure and Sn-doped ZnO thin films

In this work, we report the transparent pure and Sn-doped zinc oxide (ZnO). The films were deposited onto microscope glass substrate which was heated at 350±5C° by ultrasonic spray pyrolysis (U S P) deposition technique. The concentrations of Sn were selected within the range of 0-3% by step of 0.5%...

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Bibliographic Details
Main Authors: Attaf N., Aida M.S., Benhaliliba M., Mokhtari H., Ocak Y.
Format: Article
Language:English
Published: EDP Sciences 2013-03-01
Series:EPJ Web of Conferences
Subjects:
ZnO
ultrasonic spray pyrolysis
Sn-doping
X-rays patterns
optical properties
electrical properties
spectroscopy ellipsometry
refractive index
Online Access:http://dx.doi.org/10.1051/epjconf/20134403006

Internet

http://dx.doi.org/10.1051/epjconf/20134403006

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