Laser-based defect characterization and removal process for manufacturing fused silica optic with high ultraviolet laser damage threshold

Laser-based defect characterization and removal process for manufacturing fused silica optic with high ultraviolet laser damage threshold

Residual processing defects during the contact processing processes greatly reduce the anti-ultraviolet (UV) laser damage performance of fused silica optics, which significantly limited development of high-energy laser systems. In this study, we demonstrate the manufacturing of fused silica optics w...

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Bibliographic Details
Main Authors: Xiaocong Peng, Xin Cheng, Chaoyang Wei, Songlin Wan, Kaizao Ni, Zhenqi Niu, Yichi Han, Zhigang Jiang, Zhen Cao, Jianda Shao
Format: Article
Language:English
Published: Light Publishing Group 2023-07-01
Series:Light: Advanced Manufacturing
Subjects:
fused silica
laser materials processing
defect characterization
subsurface damage
process chain
Online Access:https://www.light-am.com/article/doi/10.37188/lam.2023.021

Internet

https://www.light-am.com/article/doi/10.37188/lam.2023.021

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