Test Case Generation Method for Increasing Software Reliability in Safety-Critical Embedded Systems
Finite-state machines (FSMs) and the W method have been widely used in software testing. However, the W method fails to detect post-processing errors in the implementation under test (IUT) because it ends testing when it encounters a previously visited state. To alleviate this issue, we propose an e...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-05-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/9/5/797 |