Test Case Generation Method for Increasing Software Reliability in Safety-Critical Embedded Systems
Finite-state machines (FSMs) and the W method have been widely used in software testing. However, the W method fails to detect post-processing errors in the implementation under test (IUT) because it ends testing when it encounters a previously visited state. To alleviate this issue, we propose an e...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2020-05-01
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| Series: | Electronics |
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| Online Access: | https://www.mdpi.com/2079-9292/9/5/797 |
| _version_ | 1797568173554270208 |
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| author | Bongjoo Koo Jungho Bae Seogbong Kim Kangmin Park Hyungshin Kim |
| author_facet | Bongjoo Koo Jungho Bae Seogbong Kim Kangmin Park Hyungshin Kim |
| author_sort | Bongjoo Koo |
| collection | DOAJ |
| description | Finite-state machines (FSMs) and the W method have been widely used in software testing. However, the W method fails to detect post-processing errors in the implementation under test (IUT) because it ends testing when it encounters a previously visited state. To alleviate this issue, we propose an enhanced fault-detection W method. The proposed method does not stop the test, even if it has reached a previously visited state; it continues to test and check the points that the W method misses. Through various case studies, we demonstrated software testing using the W method and the proposed method. From the results, it can be inferred that the proposed method can more explicitly determine the consistency between design and implementation, and it is a better option for testing larger software. Unfortunately, the testing time of the proposed method is approximately 1.4 times longer than that of the W method because of the added paths. However, our method is more appropriate than the W method for software testing in safety-critical systems, even if this method is time consuming. This is because the error-free characteristics of a safety-critical system are more important than anything else. As a result, our method can be used to increase software reliability in safety-critical embedded systems. |
| first_indexed | 2024-03-10T19:52:40Z |
| format | Article |
| id | doaj.art-81d9c042758349d2832560289c364a73 |
| institution | Directory Open Access Journal |
| issn | 2079-9292 |
| language | English |
| last_indexed | 2024-03-10T19:52:40Z |
| publishDate | 2020-05-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Electronics |
| spelling | doaj.art-81d9c042758349d2832560289c364a732023-11-20T00:13:58ZengMDPI AGElectronics2079-92922020-05-019579710.3390/electronics9050797Test Case Generation Method for Increasing Software Reliability in Safety-Critical Embedded SystemsBongjoo Koo0Jungho Bae1Seogbong Kim2Kangmin Park3Hyungshin Kim4Agency for Defense Development, Daejeon 34186, KoreaAgency for Defense Development, Daejeon 34186, KoreaAgency for Defense Development, Daejeon 34186, KoreaAgency for Defense Development, Daejeon 34186, KoreaComputer Engineering Department, Chungnam National University, Daejeon 34134, KoreaFinite-state machines (FSMs) and the W method have been widely used in software testing. However, the W method fails to detect post-processing errors in the implementation under test (IUT) because it ends testing when it encounters a previously visited state. To alleviate this issue, we propose an enhanced fault-detection W method. The proposed method does not stop the test, even if it has reached a previously visited state; it continues to test and check the points that the W method misses. Through various case studies, we demonstrated software testing using the W method and the proposed method. From the results, it can be inferred that the proposed method can more explicitly determine the consistency between design and implementation, and it is a better option for testing larger software. Unfortunately, the testing time of the proposed method is approximately 1.4 times longer than that of the W method because of the added paths. However, our method is more appropriate than the W method for software testing in safety-critical systems, even if this method is time consuming. This is because the error-free characteristics of a safety-critical system are more important than anything else. As a result, our method can be used to increase software reliability in safety-critical embedded systems.https://www.mdpi.com/2079-9292/9/5/797finite-state machineW methodpost-processing errorsimplementation under testenhanced fault-detection W methodsoftware reliability |
| spellingShingle | Bongjoo Koo Jungho Bae Seogbong Kim Kangmin Park Hyungshin Kim Test Case Generation Method for Increasing Software Reliability in Safety-Critical Embedded Systems Electronics finite-state machine W method post-processing errors implementation under test enhanced fault-detection W method software reliability |
| title | Test Case Generation Method for Increasing Software Reliability in Safety-Critical Embedded Systems |
| title_full | Test Case Generation Method for Increasing Software Reliability in Safety-Critical Embedded Systems |
| title_fullStr | Test Case Generation Method for Increasing Software Reliability in Safety-Critical Embedded Systems |
| title_full_unstemmed | Test Case Generation Method for Increasing Software Reliability in Safety-Critical Embedded Systems |
| title_short | Test Case Generation Method for Increasing Software Reliability in Safety-Critical Embedded Systems |
| title_sort | test case generation method for increasing software reliability in safety critical embedded systems |
| topic | finite-state machine W method post-processing errors implementation under test enhanced fault-detection W method software reliability |
| url | https://www.mdpi.com/2079-9292/9/5/797 |
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