Start-to-end simulation of single-particle imaging using ultra-short pulses at the European X-ray Free-Electron Laser

Start-to-end simulation of single-particle imaging using ultra-short pulses at the European X-ray Free-Electron Laser

Single-particle imaging with X-ray free-electron lasers (XFELs) has the potential to provide structural information at atomic resolution for non-crystalline biomolecules. This potential exists because ultra-short intense pulses can produce interpretable diffraction data notwithstanding radiation dam...

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Bibliographic Details
Main Authors: Carsten Fortmann-Grote, Alexey Buzmakov, Zoltan Jurek, Ne-Te Duane Loh, Liubov Samoylova, Robin Santra, Evgeny A. Schneidmiller, Thomas Tschentscher, Sergey Yakubov, Chun Hong Yoon, Michael V. Yurkov, Beata Ziaja-Motyka, Adrian P. Mancuso
Format: Article
Language:English
Published: International Union of Crystallography 2017-09-01
Series:IUCrJ
Subjects:
single-particle imaging
X-ray free-electron lasers
simulations
diffraction
scattering
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252517009496

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http://scripts.iucr.org/cgi-bin/paper?S2052252517009496

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