High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method

High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method

This article provides data on the scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) images of InAs(001) surface. Using the frequency-modulation (FM) method in AFM and KPFM, atomic resolution topography and contact potential difference (CPD)...

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Bibliographic Details
Main Authors: Young Min Park, Joon Sik Park, Choong-Heui Chung, Sangyeob Lee
Format: Article
Language:English
Published: Elsevier 2020-04-01
Series:Data in Brief
Online Access:http://www.sciencedirect.com/science/article/pii/S2352340920300718

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http://www.sciencedirect.com/science/article/pii/S2352340920300718

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