Transparent Memory Tests Based on the Double Address Sequences

An important achievement in the functional diagnostics of memory devices is the development and application of so-called transparent testing methods. This is especially important for modern computer systems, such as embedded systems, systems and networks on chips, on-board computer applications, net...

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Bibliographic Details
Main Authors: Ireneusz Mrozek, Vyacheslav N. Yarmolik
Format: Article
Language:English
Published: MDPI AG 2021-07-01
Series:Entropy
Subjects:
Online Access:https://www.mdpi.com/1099-4300/23/7/894