Transparent Memory Tests Based on the Double Address Sequences
An important achievement in the functional diagnostics of memory devices is the development and application of so-called transparent testing methods. This is especially important for modern computer systems, such as embedded systems, systems and networks on chips, on-board computer applications, net...
Main Authors: | , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2021-07-01
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Series: | Entropy |
Subjects: | |
Online Access: | https://www.mdpi.com/1099-4300/23/7/894 |